Includes bibliographical references and author index.
|Other titles||Thin film physics and applications|
|Statement||Junhao Chu ... [et al.], editors ; organized and sponsored by Chinese Physical Society (China) ... [et al.].|
|Series||SPIE proceedings series,, v. 5774, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 5774.|
|Contributions||Chu, Junhao., Zhongguo wu li xue hui., Society of Photo-optical Instrumentation Engineers.|
|LC Classifications||QC176.82 .I572 2004|
|The Physical Object|
|Pagination||xxiii, 654 p. :|
|Number of Pages||654|
|LC Control Number||2005298615|
Fifth International Conference on Thin Film Physics and Applications: 31 May-2 June , Shanghai, China. Date Published: 8 December PDF: 4 pages Proc. SPIE , Fifth International Conference on Thin Film Physics and Applications, (8 December ); doi: / Show Author Affiliations Fuwen Shi, Shanghai Institute of Technical Physics, CAS (China) Genshui Wang, Shanghai Institute of Technical Physics, CAS (China) Xiangjian Meng. C60 took the role as annihilation in AUMPc, the photoconductivity of the Complex thin film was clearly increased when the film was exposed in the light. Paper Details Date Published: 8 December PDF: 4 pages Proc. SPIE , Fifth International Conference on Thin Film Physics and Applications, (8 December ); doi: / Physics of Thin Films: Advances in Research and Development primarily deals with the influence of ions or optical energy on the deposition, properties, and etching on thin films. The book is a collection of five articles, with one article per chapter. Chapter 1 covers ionized cluster beam deposition; epitaxy; and film-formation Edition: 1.
proceedings volume Third International Conference on Thin Film Physics and Applications Editor(s): Shixun Zhou; Yongling Wang; Yi-Xin Chen ; Shuzheng Mao. Sixth International Conference on Thin Film Physics and Applications Editor(s): Wenzhong Shen ; Junhao Chu For the purchase of this volume in printed format, please visit HANDBOOK OF THIN-FILM DEPOSITION PROCESSES AND TECHNIQUES Principles, Methods, Equipment and Applications Second Edition Edited by Krishna Seshan Intel Corporation Santa Clara, California NOYES PUBLICATIONS WILLIAM ANDREW PUBLISHING Norwich, New York, U.S.A. View Thin film (Physics) Research Papers on for free.
Structural and surface morphology of the film were identified by X-ray diffractogram and Scanning Electron Microscopy. The composition was verified by EDAX and XPS spectrum. The results of conductivity measurements (Tsb =K) have revealed that thermionic emission and variable range hopping (VRH) are the two dominant conduction mechanisms in the temperature ranges of ( Author: C. Viswanathan, S. Gopal, B. Karunagaran, Devanesan Mangalaraj, Sa. K. Narayandass, J. Yi. This International Conference provides a multi-disciplinary forum for recent advances in basic research, development and applications of thin films and coatings. This conference will present a unique opportunity for researchers, engineers and managers to acquire new knowledge of thin films . In: Proccedings of the fifth international conference on thin film physics and applications. SPIE--The International Society for Optical Engineering., CHN, pp. ISBN Full text not available in this t a copy from the Strathclyde author AbstractCited by: 1. Event: Fifth International Conference on Thin Film Physics and Applications, , Shanghai, China ARTICLE CITED BYAuthor: Guangpu Wei, Deng-Ren Jin.